Reading, Mike; Price, Duncan M.; Pollock, Hubert M.; Hammiche, Azzedine; Murray, Andrew; Recent progress in microthermal analysis. American Laboratory 31(1) Jan (1999) 13-16
Microthermal analysis of samples is achieved by combining scanning probe microscopy with microthermal analytical techniques. This paper presents a novel application for semiconductor devices and an extension of microthermal analysis in which the entire sample is heated using a hot stage.
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